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Semi-Insulating ,GaAs Substrate With High Mobility , 2”,Prime Grade,Epi Ready
PAM-XIAMEN provides both single crystal and polycrystalline GaAs wafer ( Gallium Arsenide ) for opto-electronics and micro-electronics industry for making LD , LED , microwave circuit and solar cell applications , the wafers is in diameter range from 2" to 6" in various thicknesses and orientations. We offer single crystal GaAs wafer produced by two main growth techniques LEC and VGF method , allowing us to provide customers the widest choice of GaAs material with high uniformity of electrical properties and excellent surface quality . Gallium Arsenide can be supplied as ingots and polished wafer, both conducting and semi-insulating GaAs wafer , mechanical grade and epi ready grade are all available . We can offer GaAs wafer with low EPD value and high surface quality suitable for your MOCVD and MBE applications. PAM-XIAMEN can produce wide range grades: prime grade, test grade, and optical grade. Please contact our engineer team for more wafer information.
(GaAs)Gallium Arsenide Wafers,Semi-insulating for Microelectronics Applications
Item | Specifications | Remarks |
Conduction Type | Insulating | |
Growth Method | VGF | |
Dopant | Undoped | |
Wafer Diamter | 2, inch | Ingot available |
Crystal Orientation | (100)+/- 0.5° | |
OF | EJ, US or notch | |
Carrier Concentration | n/a | |
Resistivity at RT | >1E7 Ohm.cm | |
Mobility | >5000 cm2/V.sec | |
Etch Pit Density | <8000 /cm2 | |
Laser Marking | upon request | |
Surface Finish | P/P | |
Thickness | 350~675um | |
Epitaxy Ready | Yes | |
Package | Single wafer container or cassette |
Properties of GaAs Crystal
Properties | GaAs |
Atoms/cm3 | 4.42 x 1022 |
Atomic Weight | 144.63 |
Breakdown Field | approx. 4 x 105 |
Crystal Structure | Zincblende |
Density (g/cm3) | 5.32 |
Dielectric Constant | 13.1 |
Effective Density of States in the Conduction Band, Nc (cm-3) | 4.7 x 1017 |
Effective Density of States in the Valence Band, Nv (cm-3) | 7.0 x 1018 |
Electron Affinity (V) | 4.07 |
Energy Gap at 300K (eV) | 1.424 |
Intrinsic Carrier Concentration (cm-3) | 1.79 x 106 |
Intrinsic Debye Length (microns) | 2250 |
Intrinsic Resistivity (ohm-cm) | 108 |
Lattice Constant (angstroms) | 5.6533 |
Linear Coefficient of Thermal Expansion, | 6.86 x 10-6 |
ΔL/L/ΔT (1/deg C) | |
Melting Point (deg C) | 1238 |
Minority Carrier Lifetime (s) | approx. 10-8 |
Mobility (Drift) | 8500 |
(cm2/V-s) | |
µn, electrons | |
Mobility (Drift) | 400 |
(cm2/V-s) | |
µp, holes | |
Optical Phonon Energy (eV) | 0.035 |
Phonon Mean Free Path (angstroms) | 58 |
Specific Heat | 0.35 |
(J/g-deg C) | |
Thermal Conductivity at 300 K | 0.46 |
(W/cm-degC) | |
Thermal Diffusivity (cm2/sec) | 0.24 |
Vapor Pressure (Pa) | 100 at 1050 deg C; |
1 at 900 deg C |
Wavelength | Index |
(µm) | |
2.6 | 3.3239 |
2.8 | 3.3204 |
3 | 3.3169 |
3.2 | 3.3149 |
3.4 | 3.3129 |
3.6 | 3.3109 |
3.8 | 3.3089 |
4 | 3.3069 |
4.2 | 3.3057 |
4.4 | 3.3045 |
4.6 | 3.3034 |
4.8 | 3.3022 |
5 | 3.301 |
5.2 | 3.3001 |
5.4 | 3.2991 |
5.6 | 3.2982 |
5.8 | 3.2972 |
6 | 3.2963 |
6.2 | 3.2955 |
6.4 | 3.2947 |
6.6 | 3.2939 |
6.8 | 3.2931 |
7 | 3.2923 |
7.2 | 3.2914 |
7.4 | 3.2905 |
7.6 | 3.2896 |
7.8 | 3.2887 |
8 | 3.2878 |
8.2 | 3.2868 |
8.4 | 3.2859 |
8.6 | 3.2849 |
8.8 | 3.284 |
9 | 3.283 |
9.2 | 3.2818 |
9.4 | 3.2806 |
9.6 | 3.2794 |
9.8 | 3.2782 |
10 | 3.277 |
10.2 | 3.2761 |
10.4 | 3.2752 |
10.6 | 3.2743 |
10.8 | 3.2734 |
11 | 3.2725 |
11.2 | 3.2713 |
11.4 | 3.2701 |
11.6 | 3.269 |
11.8 | 3.2678 |
12 | 3.2666 |
12.2 | 3.2651 |
12.4 | 3.2635 |
12.6 | 3.262 |
12.8 | 3.2604 |
13 | 3.2589 |
13.2 | 3.2573 |
13.4 | 3.2557 |
13.6 | 3.2541 |
What is the GaAs Process?
GaAs wafers must be prepared prior to device fabrication. To start, they must be completely cleaned to remove any damage that might have occurred during the slicing process. The wafers are then Chemically Mechanically Polished/Plaranrized (CMP) for the final material removal stage. This allows for the attainment of super-flat mirror-like surfaces with a remaining roughness on an atomic scale. After that is completed, the wafer is ready for fabrication.
What is the Optical properties of GaAs Wafer?
Infrared refractive index | 3.3 |
Radiative recombination coefficient | 7·10-10 cm3/s |
Infrared refractive index
n = k1/2 = 3.255·(1 + 4.5·10-5T)
for 300 K n= 3.299
Long-wave TO phonon energy
hνTO = 33.81·(1 - 5.5·10-5 T) (meV)
for 300 K hνTO = 33.2 meV
Long-wave LO phonon energy
hνLO= 36.57·(1 - 4·10-5 T) (meV)
for 300 K hνLO = 36.1 meV
![]() | Refractive index n versus photon energy for a high-purity GaAs.(no~5·1013 cm-3). Solid curve is deduced from two-beam reflectance measurements at 279 K. Dark circles are obtained from refraction measurements. Light circles are calculated from Kramers-Kronig analysis |
![]() | Normal incidence reflectivity versus photon energy. . |
![]() | Intrinsic absorption coefficient near the intrinsic absorption edge for different temperatures. |
A ground state Rydberg energy RX1= 4.2 meV
![]() | Intrinsic absorption edge at 297 K at different doping levels. n-type doping |
![]() | Intrinsic absorption edge at 297 K at different doping levels. p-type doping |
![]() | The absorption coefficient versus photon energy from intrinsic edge to 25 eV. |
![]() | Free carrier absorption versus wavelength at different doping levels, 296 K Conduction electron concentrations are: 1. 1.3·1017cm-3; 2. 4.9·1017cm-3; 3. 1018cm-3; 4. 5.4·1018cm-3 |
![]() | Free carrier absorption versus wavelength at different temperatures. no = 4.9·1017cm-3 Temperatures are: 1. 100 K; 2. 297 K; 3. 443 K. |
At 300 K
For λ~2 µm α=6·10-18 no (cm-1) (no - in cm-1)
For λ > 4µm and 1017<no<1018cm-3α ≈ 7.5·10-20no·λ3 (cm-1) (no - in cm-3, λ - µm)
Are You Looking for GaAs Wafer?
PAM-XIAMEN is your go-to place for everything wafers, including GaAs wafers, as we have been doing it for almost 30 years! Enquire us today to learn more about the wafers that we offer and how we can help you with your next project. Our group team is looking forward to providing both quality products and excellent service for you!