XIAMEN POWERWAY ADVANCED MATERIAL CO., LTD.

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N Type , GaSb Crystal Wafer Substrate , 3”, Prime Grade, Epi-Ready

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XIAMEN POWERWAY ADVANCED MATERIAL CO., LTD.
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Province/State:fujian
Country/Region:china
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N Type , GaSb Crystal Wafer Substrate , 3”, Prime Grade, Epi-Ready

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Brand Name :PAM-XIAMEN
Place of Origin :China
MOQ :1-10,000pcs
Price :By Case
Payment Terms :T/T
Supply Ability :10,000 wafers/month
Delivery Time :5-50 working days
product name :GaSb Substrate wafer
Conduction Type :N Type
Dopant :Tellurium
Grade :Prime Grade
other name :Gallium Antimonide Wafer
Wafer Diameter :3 inch
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N Type , GaSb Crystal Wafer Substrate , 3”, Prime Grade, Epi-Ready

PAM-XIAMEN offers GaSb wafer – Gallium Antimonide which are grown by LEC(Liquid Encapsulated Czochralski) as epi-ready or mechanical grade with n type, p type or undoped in different orientation(111)or(100).Gallium antimonide (GaSb) is a crystalline compound made from the elements Gallium (Ga) and antimony (Sb).

3" GaSb Wafer Specification

ItemSpecifications
Conduction TypeN-type
DopantTellurium
Wafer Diameter3"
Wafer Orientation(100)±0.5°
Wafer Thickness600±25um
Primary Flat Length22±2mm
Secondary Flat Length11±1mm
Carrier Concentration(1-20)x1017cm-3
Mobility2000-3500cm2/V.s
EPD<2x103cm-2
TTV<12um
BOW<12um
WARP<15um
Laser markingupon request
Suface finishP/E, P/P
Epi readyyes
PackageSingle wafer container or cassette

Electrical properties of GaSb Wafer

Band structure and carrier concentration of GaSb Wafer include Basic Parameters,Mobility and Hall Effect,Transport Properties in High Electric Fields
,Impact Ionization,Recombination Parameters

Basic Parameters

Breakdown field≈5·104
Mobility electrons≤ 3000 cm2 V-1 s-1
Mobility holes≤ 1000 cm2 V-1 s-1
Diffusion coefficient electrons≤ 75 cm2/s
Diffusion coefficient holes≤ 25 cm2/s
Electron thermal velocity5.8·105 m/s
Hole thermal velocity2.1·105 m/s

Mobility and Hall Effect

N Type , GaSb Crystal Wafer Substrate , 3”, Prime Grade, Epi-ReadyElectron Hall mobility versus temperature for different doping levels.
1. Nd= 1.7·1018 cm-3
2. Nd= 2.8·1017 cm-3
Broken curves represent the experimental data. Continuous curves represent theoretical calculations.
N Type , GaSb Crystal Wafer Substrate , 3”, Prime Grade, Epi-ReadyElectron Hall mobility versus electron concentration no. T=77 K.
Open circles represent measurements with a group of samples having approximately the same residual acceptor concentrations Na. Full symbols:specimens with lower residual acceptor concentrations. Solid lines represent the theoretical calculations for different values of compensating acceptor densities - either singly (Na-) or doubly (Na--) ionized.
1. Na- = 1.2·1017 or Na-- = 0.4·1017 cm-3
2. Na- =2.85·1017 or Na-- =0.95·1017 cm-3
3. Na- = 4.5·1017 or Na-- = 1.5·1017 cm-3
N Type , GaSb Crystal Wafer Substrate , 3”, Prime Grade, Epi-ReadyHole Hall mobility versus temperature at different compensation levels.
1. Na= 1.39·1017 cm-3; Nd= 9·1015 cm-3;
2. Na= 1.3·1017 cm-3; Nd= 9.5·1016 cm-3;
3. Na= 1.1·1017cm-3; Nd= 9.5·1016 cm-3
N Type , GaSb Crystal Wafer Substrate , 3”, Prime Grade, Epi-ReadyTemperature dependence of hole Hall mobility.
MBE technique. Hole concentration at 300 K:
1. - 2.28·1016 cm-3;
2. - 1.9·1019 cm-3.
N Type , GaSb Crystal Wafer Substrate , 3”, Prime Grade, Epi-ReadyThe hole Hall mobility versus hole concentration, 300 K.
Experimental data are taken from five different papers

Transport Properties in High Electric Fields

N Type , GaSb Crystal Wafer Substrate , 3”, Prime Grade, Epi-ReadyCalculated field dependence of the electron drift velocity, 300 K.
N Type , GaSb Crystal Wafer Substrate , 3”, Prime Grade, Epi-ReadyCalculated (solid) end experimental (points) current density dependencies versus the electric field, 300 K.
N Type , GaSb Crystal Wafer Substrate , 3”, Prime Grade, Epi-ReadyFraction of electrons in Γ, L, X valleys as a function of electric field,300 K
n=6.8·1016 cm-3
N Type , GaSb Crystal Wafer Substrate , 3”, Prime Grade, Epi-ReadyElectron temperature as a function of the electric field, T=77 K.
full and open circle - experimental data
curve are calculated

Impact Ionization

N Type , GaSb Crystal Wafer Substrate , 3”, Prime Grade, Epi-ReadyThe dependences of αi and βi> versus 1/F. T=77 K
Open symbols : F (111).
Filled symbols : F (100).
N Type , GaSb Crystal Wafer Substrate , 3”, Prime Grade, Epi-ReadyThe dependences of αi and βi versus 1/F). T=300 K
F (100).

Recombination Parameters

N Type , GaSb Crystal Wafer Substrate , 3”, Prime Grade, Epi-ReadyRadiative lifetime versus donor concentration, T =77 K, GaSb(Te).
To extract these dependences from experimental data the values of internal quantum efficiency η were taken:
open circles η=0.8;
filled circles η=1;
N Type , GaSb Crystal Wafer Substrate , 3”, Prime Grade, Epi-ReadyNonradiative lifetime versus donor concentrations, T =77K, GaSb(Te).
open circles η= 0.8;
filled circles η= 1; (Agaev et al. [1984]).
N Type , GaSb Crystal Wafer Substrate , 3”, Prime Grade, Epi-ReadyElectron radiative (triangles) and nonradiative (squares) lifetime versus acceptor concentration, p-GaSb, T=77 K.
N Type , GaSb Crystal Wafer Substrate , 3”, Prime Grade, Epi-ReadyElectron lifetime versus temperature at different acceptor concentrations.
Na (cm-3): 1. 5·1018; 2. 2.2·1019; 3. 3.5·1019.

Radiative recombination coefficient~10-10 cm3 s-1
Auger coefficient
77K2·10-29 cm6s-1
300 K5·10-30 cm6s-1


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